Small and Wide Angle X-Ray Scattering – SWAXS System 3 (Hecus) Small Angle X-Ray scattering enables the determination of pore sizes, inner structures of polysaccharide materials up to 80 nm. We are also able to characterize particle suspensions (e.g. cellulose nanocrystals), even in at concentrated solutions. Wide angle X-Ray scattering: Determination of crystallinity and atom distances in the Angström range.