SEM with EDX – SUPRA 35 VP (Carl Zeiss) with Inca 400 (Oxford Instruments)

Scanning Electron Microscopy is a complimentary technique for the investigation of the surface morphology. It can be used in combination with EDX detectors which are able to identify the elemental composition of the sample. This is extremely useful when coatings are applied to all types of cellulosic fibers. Impurities in the course of the coating procedures of cellulosic samples can be detected. Suitable samples: fibers, pulps, films, model surfaces in dry state.